Silicon X-Ray Characterization Services
Embedded Memory Validation, Model Fine-tuning,
Failure Analysis, Porting and Re-targeting.
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Legend's engineering experts are an extension of your design team,
and have successfully worked on hundreds of memory
The Need
IC and SOC designs are becoming more memory dominant now. Due to sophisticated
design, sensitivity to technology and complicated integration, the issues
and problems are increasing on embedded memories. To shorten 'Time-to-Market',
customers need the services for working silicon and good yield.
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The Customers
- Who need analyze the 'silicon failures' due to memory
- Who need 'validate' the memory for failure prevention
- Who need re-characterize the memory for 'porting' or 're-targeting'
- Who need verify the memory for 'critical timing' and fine-tune the models
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The Scope
- Characterize and simulate the circuits on multiple process corners and complete
timing/power data including access time, setup/hold time, and clock cycle etc.
- Extract the circuits with RC from layout(optional)
- Engineering expertise with leading edges of tools and patented technology
- MSLTM, SpiceCutTM, MemCharTM and MSIM®
- Successes with hundreds of memories
The Example of Symptoms
- Not functioning at 1.8V. Only work after raising to 2.2V
- Access time is twice slower on chip compared to the spec.
- Hold time in slow corner is much larger than the spec.
- Abnormal dependency of read/write operation on temperature.
The Applications
- Qualification for IP selection and decision
- Make the choice on memory compilers
- Validation for failure prevention
- Fine-tuning timing/power models for performance
- Debugging by 'what-if' simulations
- Failure Analysis for yield and function
- Porting and Re-targeting for legacy-usage
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